| 摘要 |
Level sensitive scan design (LSSD) scan strings on an integrated digital logic circuit chip are employed for multiple functions of providing control parameters to logic blocks on the integrated circuit chip, and for providing reconfiguration messages to reconfiguration logic on the integrated circuit chip, in addition to the normal function of transferring test data to various portions of the integrated circuit chip. This reduces the number of input/output pads on the integrated circuit chip which must be dedicated to these functions. |
