发明名称 TESTING METHOD OF BUBBLE MEMORY ELEMENT
摘要 PURPOSE:To obtain an efficient testing method and realize an analyzing means for an error occurrence mode by superposing a pseudo pulse at the optional phase position of the driving signal of a rotating magnetic field coil and providing an off time in the operation test of a memory element, and generating pseudo noise in a rotating magnetic field artificially. CONSTITUTION:When a control part 11 sends out an opposite-polarity pulse with preset pulse width to the optional phase position of the driving signal by a pulse generator 13 according to a control program and control data, an AND circuit 14 obtains no logical product as to the part of the opposite-polarity pulse, so an input signal to a coil driving part 15 has a tooth absence part at the opposite-polarity pulse part and the coil current of a corresponding part, i.e. current LY in this case varies discontinuously to cause the abnormality of variation of the rotating magnetic field. For the purpose, the control part 11 performs control so that the phase of said part varies sequentially to obtain the same effect with the pseudo superposition of the noise at the optional phase position.
申请公布号 JPS59217287(A) 申请公布日期 1984.12.07
申请号 JP19830091747 申请日期 1983.05.25
申请人 FUJITSU KK 发明人 MORI YUTAKA
分类号 G11C29/00;G11C11/14;G11C29/04;G11C29/56;(IPC1-7):G11C11/14;G11C19/08 主分类号 G11C29/00
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