发明名称 APPARATUS FOR DETECTING SURFACE POTENTIAL
摘要 PURPOSE:To restore the real surface potential distribution of an object to be measured, by subjecting the deterioration of measured data generated in measurement to correction treatment on the basis of frequency response deterioration information by a control and calculation apparatus in such a state that said deterioration information generated in a measuring system is preliminarily applied to the control and calculation apparatus. CONSTITUTION:The leading end part of a detection electrode 3 is allowed to approach a charged recording body 1. By this operation, charge is induced in the detection electrode 3 by electrostatic induction and, at the same time, voltage proportional to the magnitude of the surface potential of the charged recording body 1 is generated in a capacitors 5. This voltage is amplified by a high accuracy DC amplifier 6 and the surface potential is calculated from this voltage. An apparatus for storing a wave form digitally and outputting the same and a calculator for performing Fourier transform and inverse Fourier transform are used in a surface potentiometer. By this simple constitution, data deterioration generated in measuring surface potential can be restored and, therefore, the surface potential distribution of an object to be measured can be calculated accuratly with high accuracy.
申请公布号 JPS59217170(A) 申请公布日期 1984.12.07
申请号 JP19830090708 申请日期 1983.05.25
申请人 HITACHI SEISAKUSHO KK 发明人 SHIMADA AKIRA;ANZAI MASAYASU
分类号 G01R29/12;G01R19/00;G01R29/24 主分类号 G01R29/12
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