| 摘要 |
<p>PURPOSE:To test a peripheral circuit within a short period by providing a shift register for reading out a memory cell by using a reading signal and a reading circuit. CONSTITUTION:For testing the peripheral circuit of the memory cell 11, specific data are inputted from a shift register data input 13 to the shift register 12 on the basis of a clock signal inputted from a shift register shift clock input 14. Then, address signals are inputted from address inputs 1, 2 and a shift register selecting signal is inputted from a shift register selecting input 3 to select a specific bit of the shift register 12 by a row decoder 5 and a column decoder 10 on the basis of the input signals. The contents of the selected bit are read out by using a row selector 9 and a reading/writing circuit 8 similarly to the reading of the memory cell 11 and outputted from a data I/O 6 and a shift register data output 7.</p> |
