发明名称 Inspection apparatus
摘要 Systems that judge the good or bad of moving objects to be inspected by processing image signals from a video camera which picks up the objects at an inspection circuit, are disclosed whereas each time the moving objects to be inspected arrive at the position to be inspected, a position detection signal is generated from a position detection system. This position detection signal drives the light source to irradiate light for a short time period onto the object to be inspected when it arrives at the inspection position and then such irradiated inspected object is picked up by the video camera as a static image. In this case, the image signal and position detection signal are both applied to a signal process and generation circuit so that this circuit generates a control signal with the voltage corresponding to the level of the image signal of the first field and also an enable signal at high level during the second field period of the image signal, and then the image signal, control signal as well as enable signal are all fed to the inspection circuit to drive the same during the period in which the enable signal is at high level, whereby the inspection system carries out the inspection to judge the good or bad of the inspected objects based on the image signal of the second field.
申请公布号 US4486776(A) 申请公布日期 1984.12.04
申请号 US19820386708 申请日期 1982.06.09
申请人 HAJIME INDUSTRIES, LTD. 发明人 YOSHIDA, HAJIME
分类号 B07C5/12;G01N21/88;G01N21/90;G01N21/94;G07C3/14;H04N7/18;(IPC1-7):H04N7/18;G01P3/40;G06K9/32 主分类号 B07C5/12
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