发明名称 MASS ANALYZING DEVICE
摘要 Mass spectrometer in which both the aperture aberrations in the radial plane and the inclination of the image plane (P) are corrected. The correction comes from the simultaneous adjusting of at least three parameters: the radii of curvature R1 and R2 of the entrance and exit faces of the magnetic sector (5) of the spectrometer, and the coupling coefficient, k, of a sextupole (6) disposed between the magnetic sector and the image plane (P) of the spectrometer. When focusing, this results in solving a system of three equations (the aperture aberrations being defined by two coefficients A and B and the angle of inclination by a coefficient I) in which the variables are the three parameters R1, R2 and k. <IMAGE>
申请公布号 JPS59209257(A) 申请公布日期 1984.11.27
申请号 JP19840088516 申请日期 1984.05.04
申请人 KAMEKA 发明人 BERUNAARU RASAARU
分类号 H01J49/20;G01N27/62;H01J49/22;H01J49/26;H01J49/30;H01J49/32 主分类号 H01J49/20
代理机构 代理人
主权项
地址