| 摘要 |
PURPOSE:To improve the reliability of an additional processing device, by performing the test of an additional device by means of the microprogram of an additional processing device by utilizing the idling time of the additional processing device connected with a CPU and confirming that the additional device is always in a normal condition. CONSTITUTION:A main storage device 2, CPU3, and additional processing devices, such as floating point arithmetic device and decimal arithmetic device, are connected with a communication channel 1. The additional processing device 4 performs operation tests in accordance with the microprogram of a built-in test data storing circuit 46 not only in the wake-up time, but also in the idling time. When an additional processing request is appointed 41 from a host computer during the course of test, the processing device 4 executes 47 the instruction in accordance with the appointment of the additional processing instruction by saving the data of the program being tested in a test data saving circuit 48 and the program in a testing microprogram address saving circuit 49. When the additional processing instruction is terminated, the processing device 4 informs 43 the host computer of the processed result, and then, reads out the saved data 48 and program 49 and restarts the test. The test resut is informed to the high order device. By means of this arramgement, the reliability of the additional processing device can be improved. |
