发明名称 Testing apparatus for redundant memory.
摘要 <p>Only that data which relates to detected failures of data stored in a memory under test is stored in a compressed data matrix of a small capacity which is determined by a predetermined number of redundant lines to be selected for remedy of the failures, and the selection of the redundant lines is effected during the execution of a test on the memory. Analysis leading to redundant line selection is effected on the data stored in this compressed matrix.</p>
申请公布号 EP0125633(A2) 申请公布日期 1984.11.21
申请号 EP19840105285 申请日期 1984.05.10
申请人 HITACHI, LTD. 发明人 KAWAGUCHI, IKUO
分类号 G06F11/20;G11C29/00;(IPC1-7):11C29/00 主分类号 G06F11/20
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