发明名称 |
Solid-state imaging device having a reduced image lag |
摘要 |
A solid-state imaging device has a semiconductor substrate of one conductive type. A plurality of light-charge converter regions, of the opposite conductivity type, are formed in the semiconductor substrate. A charge-voltage converter region, formed in the semiconductor substrate, converts the electric charge produced by the light-charge converter regions into a voltage. At least one charge transfer section is formed in the semiconductor substrate for transferring the electric charge produced by the light-charge converter regions to the charge-voltage converter region. At least one charge transfer gate section is in the semiconductor substrate and has a gate electrode for controlling the timing of a transfer of the electric charges from the light-charge converter regions to the charge transfer section. Pulses are generated with a predetermined pulse potential and applied to the gate electrode in the charge transfer gate section. The predetermined pulse potential has the relationship VB+2 phi FP<VTG sub where; VB represents a voltage which completely depletes the light-charge converter region; phi FP represents a difference between a Fermi level of the semiconductor substrate not containing an impurity; and VTG sub represents a potential generated at the semiconductor substrate in the charge transfer gate section by the mentioned pulse.
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申请公布号 |
US4484210(A) |
申请公布日期 |
1984.11.20 |
申请号 |
US19810297759 |
申请日期 |
1981.08.31 |
申请人 |
NIPPON ELECTRIC CO., LTD. |
发明人 |
SHIRAKI, HIROMITSU;TERANISHI, NOBUKAZU;ISHIHARA, YASUO |
分类号 |
H01L27/148;(IPC1-7):H01L29/78;H01L27/14;H01L31/00 |
主分类号 |
H01L27/148 |
代理机构 |
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地址 |
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