| 摘要 |
PURPOSE:To perform fast defect inspection through a simple circuit by converting a video signal into the binary signal of a defect part and a nondefect part, and counting a clock pulse from a lower limit value until the generation of a defect part. CONSTITUTION:A comparing means 110 compares the video signal of a line sensor 100 which photographs an object with a preset defect detection level and converts it into the binary signals of the defect part and nondefect part. A defect detecting means 130 counts the clock pulse synchronizing with the picture- element scanning of the sensor 100 from the lower limit value corresponding to the lower-limit position of a preset inspection area until the defect part is generated in the binary signal. Then, a defect presence signal is outputted when the counting result is below the upper-limit value corresponding to the upper-limit position of the inspection area. Consequently, numbers of articles are inspected simultaneously and speedily through the simple constitution. |
