发明名称 ELECTRONIC LOCK TESTING APPARATUS AND SYSTEM
摘要 An electronic lock testing device and system. The device comprises: a rotation component (102) fastened to a base (208) via a rotation support (210); a simulation unlocking device (104) connected to the rotation component (102) and configured to unlock, at a target position corresponding to an electronic lock under test (506), the electronic lock under test (506), wherein the simulation unlocking device (104) rotates, under driving of the rotation component (102), toward the target position; a handle-driving component (106) including a handle slider (304) near a handle (306) of the electronic lock under test (506) and configured to drive the handle slider (304) to perform a downward pressing action when the electronic lock under test (506) is successfully unlocked, such that the handle slider (304) presses the handle (306) of the electronic lock under test (506) downward; and a control component (108) connected to the simulation unlocking device (104) and handle-driving component (106) and configured to control actions of the simulation unlocking device (104) and handle-driving component (106). By employing the device and system, the present invention addresses the technical problem of low testing efficiency due to manual repetition of lock testing operation.
申请公布号 HK1212431(A1) 申请公布日期 2016.06.10
申请号 HK20160100431 申请日期 2016.01.15
申请人 ZHANG ZE 发明人 ZHANG ZE
分类号 G01M 主分类号 G01M
代理机构 代理人
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