发明名称 APPARATUS FOR IMPROVING FLATNESS OF POLISHED WAFERS
摘要 <p>The flatness of a polished semiconductor wafer is improved using an appts. having a thin deformable carrier disc (5) mounted on a resilient ring(7) on a rotatable pressure plate(9). The assembly forms a chamber(41) that is connected to vacuum(37), so that the disc can be deformed into an inwardly convex shape with the wafers mounted on the concave surface. A polishing pad(19) contacting the wafers is mounted on a turntable(21) that is internally cooled to dissipate heat from the pad and turntable surface. The difference in the turntable surface temps. results in thermal bowing of the turntable towards the concave surface. The wafers are pref. mounted with wax(3) , and the turntable provides frictional drive rotation of the pressure plate assembly.</p>
申请公布号 KR840002114(B1) 申请公布日期 1984.11.15
申请号 KR19810001005 申请日期 1981.03.27
申请人 MONSANTO LTD. 发明人 WALSH, ROBERT J.
分类号 H01L21/304;B24B37/015;B24B37/30;B24B49/14;B24B55/02;H01L31/00;(IPC1-7):01L21/304 主分类号 H01L21/304
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