发明名称 Digital device testing apparatus and method
摘要 Testing apparatus monitors signals at selected test points in a tested device. An operator specifies sets of signals defining a display window during which all signals at the selected test points will be available to the operator for immediate or later examination. One set of signals defines the beginning of the window. Another set defines the end of the window, but only after other sets or conditions, also specified by the operator, occur. For each set, the operator specifies test points monitored, signal states expected and what happens when the expected states occur.
申请公布号 US4483002(A) 申请公布日期 1984.11.13
申请号 US19820369782 申请日期 1982.04.19
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 GROOM, JR., JAY L.;SMITH, PATRICIA J.;VAIR, GARY G.
分类号 G01R31/28;G01R13/28;G01R31/319;G06F11/22;G06F11/267;G06F11/32;(IPC1-7):G06F11/00 主分类号 G01R31/28
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