| 摘要 |
PURPOSE:To detect the distribution state of compounds as the image by moving continuously the X-ray irradiation to the direction of X and Y axes of a sample surface to be measured, and synchronizing the X-ray diffraction intensity and the position of the surface to be measured. CONSTITUTION:A primary X-rays 2 are irradiated on the surface of a sample 3 of the measuring object. The secondary X-rays 4 diffracted from each part 10, 11, 12 are detected by an X-ray detector 4 fixed at each diffracting position of the diffractin peaks of Fe2O3 and Fe3O4, and the X-ray diffraction intensity is displayed on a recorder 5. Simultaneously to this, the sample 3 is moved continuously by an X-axis driving motor 13 and a Y-axis driving motor 14, and when the moving distance of the sample 3 is moved continuously only along X- axis, the diffraction intensity is synchronized and recorded as shown in a sample X-axis recorder 15. When the Y-axis is synchronized to the X-axis, the X-ray diffraction intensity is displayed as the plane distribution as shown in a sample Y-axis recorder 17. |
