AMBIENT LIGHT SENSOR TEST APPARATUS

摘要

The present invention relates to an ambient light sensor test device inspecting normality and abnormality in an operation state of each ambient light sensor in a wafer or a module in which an ambient light sensor is installed. The ambient light sensor test device inspects the normality and the abnormality in the each ambient light sensor in the wafer in which multiple ambient light sensors (ALS) are installed. The ambient light sensor test device includes: a light source radiating light to the wafer; a power unit supplying power source to the light source; a light detector detecting illumination intensity (Lux) radiated from the light source and reflected from the wafer in real time; and a control unit controlling the state of the illumination intensity radiated from the light source so that the state of the illumination intensity is changed in seconds. Therefore, the ambient light sensor test can reduce manufacturing costs of the ambient light sensor.