| 摘要 |
PURPOSE:To enable to readily perform optimum screen setting by a microscope wherein monitored waveforms are displayed on an X-Y CRT with the axis of abscissas representing scan of a mechanical scanning system in the X-axis direction and with the axis of ordinate representing a brightness input signal. CONSTITUTION:An X-axis scanning signal, a Y-axis scanning signal and a brightness signal from a reflection type ultrasonic scanning microscope are connected to a microscopic image displaying X-Y CRT 900 and a waveform monitoring X-Y CRT 910. On a screen 910a of the waveform monitoring Braun tube 910, as indicated at (a) in the lower figure, time-dependent changes with X-axis scanning of the Z-axis brightness signal is directly monitored with the axis of abscissa representing the amplitude of mechanical scan and the axis of ordinate representing the output of a sampling circuit. By adjusting the device with an operator allowing the Z-axis brightness signal to fall in a range between an upper limit l1 and a lower limit l2, it becomes possible to obtain an image optimum in brightness, contrast and gradation. |
