发明名称 INSPECTING DEVICE FOR SEMICONDUCTOR AND PRINTED CIRCUIT BOARD
摘要 PURPOSE:To prevent poor inspection due to missetting while simplifying the circuit dispensing with a dedicated D/A converter by a method wherein after a constant current is applied to a load, the voltage given is compared with the prescribed value to determine the propriety thereof and the output voltage of a constant current circuit automatically clamped at the prescribed value. CONSTITUTION:In the embodiment, this is composed of a D/A converter 1 of the value of current applied, a D/A converter 2 for the prescribed value of a measuring voltage, an amplifier A1 for generating an applied current, a load 3 connected to a terminal T, a resistor R1 for detecting current flowing through the load 3, a differential amplifier A2 for detecting a voltage across the resistor R1, D1, D2, S1 and S2 for setting a clamping voltage, a comparator A3 and the like. With such an arrangement, the output of the comparator A3 is OFF, current flowing through the load 3 turns to a constant current according to the output voltage of the D/A converter 1 and when the load is abnormal, the voltage at the terminal T rises or falls. But it is checked by the output of the comparator A3 when exceeding the clamping voltage.
申请公布号 JPS59196479(A) 申请公布日期 1984.11.07
申请号 JP19830071278 申请日期 1983.04.22
申请人 SEIKO DENSHI KOGYO KK 发明人 SEKIYA SATOSHI
分类号 G01R31/02;H01L21/66;H05K3/00 主分类号 G01R31/02
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