| 摘要 |
PURPOSE:To improve effective yield by previously integrating the number of picture elements or the number of the steps of a scanning element to values more than the quantity required, selecting a region, in which there is no defect, by inspection and ensuring the number of picture elements required. CONSTITUTION:The number of picture elements required is arranged only by n+deltan, which is increased by deltan, in the horizontal direction and m+deltam, which is increased by deltam, in the vertical direction when the horizontal direction is made (n) and the vertical direction (m). The number of the steps of a horizontal scanning circuit 3 is made n'+deltan, which is increased to the number of steps required n' by deltan steps, and the number of the steps of a vertical scanning circuit 4 ia made m'+deltam, which is increased by deltam steps. When the generation of a defect is observed in a region R or D in the selection and inspection of acceptable chips, a region I is used for an image pickup, and the number of picture elements required mXn is ensured. A clock wiring is cut at the position of a position PR or PD by using a laser trimming device, and the generation of scanning pulses outputted from a region HR in the horizontal scanning circuit 3 corresponding to the region R or a region VD in the vertical scanning circuit 4 corresponding to the region D is prevented. |
