| 摘要 |
A test probe for the testing of electrical circuits and circuit boards comprises a probe head (52) breakably coupled to an elongated probe arm (51). The breakable coupling is achieved by securing a first ring (63) to the probe arm and a second ring (60) to the probe head. The first and second rings may be respectively made of magnetic material and magnetizable material (or vice versa) thereby achieving a magnetic breakable coupling between the head and the arm. The probe head may comprise one or a plurality of probing pins (54,55) depending upon the type of circuit under test. The break-away feature of the test probe prevents any shearing of a solder connection as well as any damaging of the circuit boards, and/or of the probing pin or pins (FIG. 5).
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