发明名称 CONDUCTION MEMBER FOR INSPECTION OF ELECTRONIC COMPONENT
摘要 PURPOSE:To connect an electronic component to an inspecting circuit stably through simple constitution and shorten a connection conduction path by forming a conduction member of an insulating holder and a forked contactor and connecting the lead of the electronic component to the terminal of the inspecting circuit by the conduction member. CONSTITUTION:The lead of the electronic component such as an IC and the terminal of the inspecting circuit are connected mutually by the conduction member 35 consisting of the movable insulating holder part 37 and forked elastic contactor 36. Therefore, the electronic component and inspecting circuit are connected with each other stably and securely and the connection condution path is shortened to inspect even a high frequency electronic component excellently.
申请公布号 JPS59192980(A) 申请公布日期 1984.11.01
申请号 JP19830066598 申请日期 1983.04.15
申请人 MITSUTOYO SEISAKUSHO:KK 发明人 WATANABE TERUO
分类号 G01R31/18;G01R31/26;H01R33/76 主分类号 G01R31/18
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