发明名称 RONTGENDIFFRAKTOMETER
摘要 An X-ray defractometer is for measurement of samples (4) of poly-crystalline material, and involves an X-ray tube (1) with micro-focus (2) and a detector (6), whilst a collimator (3) separates a primary, limited radiated bunch of X-rays. The rays are directed towards the sample (4) which bends them causing the formation of a defraction cone. - The detector side (6) facing the sample (4) has a mixer (8) with a circular ring-shaped aperture through the defraction cone of rays passes. The X-ray tube micro-focus (2) is fitted in the tube window, and coincides with the collimator input aperture. The detector mixer has a ray catchment device which picks up the part of the X-ray radiation bunch not defracted by the sample (Provisional Basic advised week 84/51)(1/2)
申请公布号 SE8302419(L) 申请公布日期 1984.10.30
申请号 SE19830002419 申请日期 1983.04.29
申请人 BAECKLUND JOHANNES 发明人 BAECKLUND JOHANNES
分类号 G01N23/20;(IPC1-7):G01N23/20 主分类号 G01N23/20
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