发明名称 METHOD AND APPARATUS FOR PRODUCTION OF SEMICONDUCTOR
摘要 PURPOSE:To reduce the nuclei of microscopic defects, to improve the yield of semiconductor elements, and to prevent the generation of cracks in an ingot, by heating a semiconductor material with radiation, and heat-treating under specific condition. CONSTITUTION:The ingot of a semiconductor material is e.g. held in a furnace in suspended state, and annealed at high temperature with a radiation heat source composed of infrared lamps. Thereafter, the ingot is quenched to a specific temperature at plural different rates of cooling according to the temperature of the ingot, and maintained at the temperature for a definite time interval. A semiconductor element containing few nuclei of microscopic defects can be obtained in high yield by this process and the generation of cracks in the ingot can be prevented thereby.
申请公布号 JPS59190300(A) 申请公布日期 1984.10.29
申请号 JP19830060757 申请日期 1983.04.08
申请人 HITACHI SEISAKUSHO KK 发明人 SHIMIZU HIROBUMI;FUJITA MASATO;SUZUKI KAZUYA;HANAGATA FUMIAKI
分类号 C30B15/14;C30B29/06;C30B33/00;C30B33/02 主分类号 C30B15/14
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