| 摘要 |
PURPOSE:To reduce the number of terminals for a test by transmitting a test input to a test function part through a control gate provided between control terminals of a main function part and the test function part. CONSTITUTION:The operation state of the main function part 10 is set on the basis of an input from terminals S1-S3. A latch circuit 14 which constitutes the control gate is provided between those terminals S1-S3 and the test function part 12, and the test input from the terminals S1-S3 is transmitted to the test function part 12 through the circuit 14 and a decoder 16. Those terminals are used in common to reduce the number of terminals, and the constitution of an electronic circuit fitted with the testing function is simplified. |
