发明名称 MEASURING TERMINAL OF SEMICONDUCTOR ELEMENT
摘要 PURPOSE:To completely and effectively contact a measuring element with leads of a flat back type element by a simple mechanism by associating two mechanisms of a contacting mechanism for holding the outside of the lower part from both sides, a contacting mechanism for holding the end face of a projection from both sides, and a contacting mechanism for pressing the side of the projection at both sides. CONSTITUTION:Measuring elements 11, 12 tilted rightward by two elasticities are stood on a stationary unit 10. The element 11 of outside is contacted with the outside of the lower part 6 of a lead at the end when bent inside, and the element 12 of inside is bent inside, and the inside is contacted with the end of the projection 7 of the lead. An eccentric cam 13 is provided at the outside of the element 11, and a spacer 14 which is made of an insulating material which is contacted with the element 12 inside the element 11 is secured. When the cam 13 is rotated, the elements 11, 12 are simultaneously tilted leftward and contacted with the leads. The measuring mechanisms symmetrical to this are provided even at the leads of leftside, the leads of the element body are simultaneously interposed from both the leftside and the rightside, and the elements are completely contacted with the leads.
申请公布号 JPS59188133(A) 申请公布日期 1984.10.25
申请号 JP19830062006 申请日期 1983.04.08
申请人 TOUKIYOU SEIMITSU:KK 发明人 YASUNAGA MASAAKI;NARUSE SADATOSHI
分类号 H01L21/66;H01L23/50 主分类号 H01L21/66
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