| 摘要 |
PURPOSE:To perform a burn-in test efficiently by a method wherein, in a hybrid integrated circuit which has a voltage stabilized source circuit, one end of a reference voltage generator composing a part of the voltage stabilized source circuit is opened and connected to an external lead pin. CONSTITUTION:A Zener diode 25 of the Zener voltage of 5V is used for a reference voltage generator of a voltage stabilized source circuit 70. An anode terminal of the diode 25 is opened and connected to a lead pin 2 of a hybrid integrated circuit 10. When a burn-in test is performed, a voltage of 12V is applied to a source terminal 11 and an additional voltage of 2V is applied between the pin 12 and an earth terminal 13. Then a base terminal voltage of a control transistor TR51 becomes 7V which is obtained by adding 2V to the Zener voltage. Therefore, an emitter terminal voltage of the control TR is controlled at 7V so that a stress voltage of 7V, which is higher than a rated voltage of 5V, is applied to an LSI610 and an I/O circuit 620 and the burn-in test can be performed. |
