发明名称 SURFACE INSPECTING APPARATUS
摘要 PURPOSE:To enable the simultaneous inspection of a pinhole in distinction from a surface defect, by simple constitution wherein a reflective member such as a mirror is arranged in opposed relationship. CONSTITUTION:A sensor part 12 equipped with a laser beam emitting part and a beam receiving part for receiving reflected beam from a plate 1 to be inspected and a mirror 11 are arranged in opposed relation to each other so as to interpose the plate 1 to be inspected therebetween. In this case, weak reflected beam (a) due to interference in the defect part of the plate 1 to be inspected and strong reflected beam (b) through a pinhole and the mirror 11 are respectively received in good separability by the sensor part 12. By this mechanism, the pinhole can be simultaneously inspected in distinction from a surface defect by simple constitution.
申请公布号 JPS59183350(A) 申请公布日期 1984.10.18
申请号 JP19830058271 申请日期 1983.04.01
申请人 MITSUBISHI DENKI KK 发明人 TAKEUCHI MUNEAKI
分类号 G01N21/89;G01N21/894 主分类号 G01N21/89
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