发明名称 DIRECT PROCESS FOR THE PRODUCTION OF CHROME MASKS WITH A PATTERN GENERATOR
摘要 Reticle patterns are formed upon a chrome-coated plate by means of forming a resist pattern upon the surface of the chrome having a predetermined thickness at which resonant absorption phenomenon occurs and a maximum rate of development is achieved. The resist layer should comply with the relationship <IMAGE> where lambda is representative of the chosen wavelength of the light source used to expose the resist, n is representative of the index of refraction of the resist for that chosen wavelength, and k is an integer ranging from 0 to 4. Resists with such thicknesses establish stationary wave phenomena in order to permit use of very thin resist layers. The value of k should preferably be one, for a resist thickness of about 1800 A where n equals 1.63 and lambda is about 4050 A for xenon lamps. The resist is then exposed by a pattern generator, developed, and a positive or negative pattern is formed by means of etching or a lift-off technique, respectively.
申请公布号 DE3069141(D1) 申请公布日期 1984.10.18
申请号 DE19803069141 申请日期 1980.05.29
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION;COMPAGNIE IBM FRANCE 发明人 DESCAMPS, DENIS;GUERMONT, DANIEL;PIACZINSKI, ZBIGNIEW;SAUTEREAU, JACQUES
分类号 G03F1/68;G03F1/76;G03F7/16;G03F7/20;G03F7/42;H01L21/027 主分类号 G03F1/68
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