发明名称 METHOD AND APPARATUS FOR MEASURING SPECTRAL PURITY
摘要 PURPOSE:To enable purity measurement at a high speed with high accuracy, by adjusting the frequency and level of a reference signal from FM linear detection output due to both of oscillator output and the reference signal while ascertaining the normality of an oscillator output measuring system by said reference signal. CONSTITUTION:The outputs of an oscillator 7' and a reference signal generator 2 are applied to level meters 6, 7 through FM linear detectors 4, 5 of which the local frequencies are controlled by the control part 8 of respective measuring systems. In this case, the generator 2 is controlled through the control part 8 so as to make the outputs of the meters 6, 7 same and the frequency and level of a reference signal become equal to oscillation signal frequency and the level thereof. Subsequently, when the measuring systems are changed over through a switch 3, the normality of the detector 4 is ascertained by the reference signal and, at the same time, the oscillation output spectral purity is measured by the meter 7. By this mechanism, the measurement of the spectral purities of the outputs of a large amount of oscillators is easily and certainly performed at a high speed with high accuracy.
申请公布号 JPS59183379(A) 申请公布日期 1984.10.18
申请号 JP19830057536 申请日期 1983.04.01
申请人 NIPPON DENKI KK 发明人 KONISHI YUKIHIKO
分类号 G01R23/00 主分类号 G01R23/00
代理机构 代理人
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