发明名称 METHOD AND DEVICE FOR OPERATING WAFER
摘要 A wafer handling method and apparatus insures proper centering of a wafer at a work station and controls the heat transferred to the wafer in a baking operation. The amount of heat transferred and the rate at which the heat is transferred to the wafer are regulated by controlling the distance between the wafer and a hot plate. The hot plate is maintained at a constant temperature higher than the bake out or equilibrium temperature to which the wafer is to be heated.
申请公布号 JPS59181617(A) 申请公布日期 1984.10.16
申请号 JP19830185215 申请日期 1983.10.05
申请人 SHIRIKON BAREI GURUUPU INC 发明人 YOHAN TAMU;YARAARU ASHIYUJIYAII;NOBUO BII KUWAKI;TSUAN MIN NGO;SUUZAN DABURIYUU KUNGU
分类号 B65G43/08;B65G49/07;B65H5/02;B65H9/14;G03F7/26;H01L21/00;H01L21/027;H01L21/677;H01L21/68 主分类号 B65G43/08
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