| 摘要 |
PURPOSE:To receive a semiconductor device immediately after a test at a high temperature regardless of the quality of material of a receiving container by temporarily stocking a semiconductor integrated circuit in a stocking section and receiving the integrated circuit in the container. CONSTITUTION:A stock sensor 9 detecting a device is arranged where separate from a stopper 5 for a receiving rail 1. The stopper 5 is opened for a time when the sensor 9 of the receiving rail 1 detects the semiconductor device 7 stopping at the position and one semiconductor device 7 approximately passes only when there is no device 7 in a shifter 2, and closed under other states. The semiconductor devices 7 to which a test at a high temperature is completed are received into the receiving rail 1 in a row in succession from the stopper 5 side because the stopper 5 is not opened until the sensor 9 transmits a detecting signal. When the devices are clogged at the position of the sensor 9, head one device is shifted to the shifter 2, and the treatment is repeated. |
