发明名称 TESTING DEVICE OF EXTERNAL APPEARANCE
摘要 PURPOSE:To obtain a practical appearance cheek by examining the selection of accuracy and the correction of positional shifting by moving the digital array of a reference picture horizontally over the whole round and comparing the digital array with that of a picture to be tested. CONSTITUTION:The digital array B of the picture to be tested is superposed by arrays A1-An formed by moving the digital array A of the reference picture over the whole round, ''1'' of the array B is erased by ''1'' of respective An and an extra solid line part is detected as the digital array BAn by regarding ''1'' of the remaining array B. The array B is superposed by the negative digital array A' of the array A and a place superposed to ''1'' of the array B is erased by ''1'' of the array A' to form an array BA'. Subsequently, the array A is superposed by arrays A'1-A'n formed by moving the array A' horizontally over the whole round, ''1'' of the array A is erased by ''1'' of respective arrays A'n, the remaining array AA'n is compared with the array BA', and the defective part of a solid line part is detected by regarding the difference part as digital array AA'n-BA'.
申请公布号 JPS59180673(A) 申请公布日期 1984.10.13
申请号 JP19830054040 申请日期 1983.03.31
申请人 SUMITOMO BAKELITE KK 发明人 KITAGAWA SHIROU
分类号 G01N21/88;G01N21/93;G01N21/94;G03F1/84;G06K9/00;G06T1/00;H01L21/027;H01L21/30;H01L21/66;H04N7/18 主分类号 G01N21/88
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