| 摘要 |
This method and device are to be designed for a higher degree of automation of the testing process following final assembly. For this purpose, it is provided to insert the devices, coming from the assembly line (1), immediately in succession into a test strip (7) where contact is established between their contact rails (13) extending in the direction of insertion and battery connection contact tabs (25, 26) protruding into the test strip (7) and accessible spatially offset with respect to one another on the device. The contact tabs (25, 26) are preferably accessible at the end faces (28) of a battery chamber (3), at a device front part in different planes with respect to the plane of the direction of transportation (6) into the test strip (7) for contact rails (13) arranged above one another. A guide groove (15) in the test strip (7) is dimensioned for the purpose of being able to remove devices found to be faulty perpendicularly with respect to the direction of transportation (6). In the case of clock mechanisms (2) and the like, a test pointer (4) is used for a functional check during the test mode in the test strip (7), which test pointer, placed in the assembly line (1), aligned by means of a directional ramp (11) prior to or during insertion of the clock mechanism (2) into the test strip (7) and, when the correct devices are pushed out of the test strip (7) ... Original abstract incomplete. <IMAGE>
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