发明名称 Microfinish measurement apparatus and technique
摘要 An apparatus and technique for measuring microfinishes of workpieces at on-line speeds. A digitized image of a finished surface of a workpiece is generated. Under microprocessor control, a distribution of the digitized values is obtained. This distribution is compared against pre-stored distributions of known surface finishes to determine the type of finish of the workpiece and/or the acceptability of the finish. The comparison is obtained using curve matching techniques and by comparison of mean gray level values.
申请公布号 US4476489(A) 申请公布日期 1984.10.09
申请号 US19820380090 申请日期 1982.05.20
申请人 INSPECTION TECHNOLOGY, INC. 发明人 WELTLICH, GARY P.;WAGNER, GARY G.
分类号 G01N21/956;(IPC1-7):H04N7/18 主分类号 G01N21/956
代理机构 代理人
主权项
地址