发明名称 |
Microfinish measurement apparatus and technique |
摘要 |
An apparatus and technique for measuring microfinishes of workpieces at on-line speeds. A digitized image of a finished surface of a workpiece is generated. Under microprocessor control, a distribution of the digitized values is obtained. This distribution is compared against pre-stored distributions of known surface finishes to determine the type of finish of the workpiece and/or the acceptability of the finish. The comparison is obtained using curve matching techniques and by comparison of mean gray level values.
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申请公布号 |
US4476489(A) |
申请公布日期 |
1984.10.09 |
申请号 |
US19820380090 |
申请日期 |
1982.05.20 |
申请人 |
INSPECTION TECHNOLOGY, INC. |
发明人 |
WELTLICH, GARY P.;WAGNER, GARY G. |
分类号 |
G01N21/956;(IPC1-7):H04N7/18 |
主分类号 |
G01N21/956 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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