Method and arrangement for optically contacting and sighting the shadow image of cylindrical measurement objects

摘要

The invention relates to a method and an arrangement for optically contacting and sighting the shadow image of measurement objects, in particular for measuring microscopes having visual and/or photoelectric shadow image contacting. The method is characterised in that the shadow image of the measurement object is sighted or contacted in a plane lying outside the axial section plane of the measurement object, and in that the measurement objects are illuminated irrespective of their curvature by means of an aperture which is essentially of the same size. The focusing of the measuring microscope employed is performed in this case with the aid of focusing means which are introduced into the illuminating beam path.