发明名称 Charged particle energy analyzer.
摘要 <p>A charged particle energy analyzer comprises a source (8) for generating radiation to be incident on a sample (10) so as to emit charged particles from the sample, a low energy pass reflection filter for selectively reflecting the charged particles having energy lower than a first value, a high energy pass transmission filter (G&lt;5&gt;) for selectively transmitting the charged particles having energy lower than a second value. The low energy pass filter comprises a reflector (4) and a first grid (G&lt;3&gt;). The reflector (4) is a spheroid mirror having two complex focuses, in a symmetrical manner, at which the sample and a detector are disposed. The detector (7) detects the selected charged particles.</p>
申请公布号 EP0120106(A1) 申请公布日期 1984.10.03
申请号 EP19830102947 申请日期 1983.03.24
申请人 KABUSHIKI KAISHA SHIMADZU SEISAKUSHO 发明人 YAMAUCHI, HIROSHI
分类号 H01J49/48;(IPC1-7):01J49/48 主分类号 H01J49/48
代理机构 代理人
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