发明名称 MEASUREMENT OF SURFACE PHYSICAL PROPERTIES
摘要 PURPOSE:To previously sense the abnormality of machinery by detecting the change in the surface physical properties of an object to be measured in high sensitivity, by attaching an exo-electron dosimeter to the surface of the object to be measured. CONSTITUTION:An exo-electron dosimeter G is formed by using a highly sensitive exo-electronic material, for example, pure aluminum as a base material and a crack C is provided to the central part thereof. The gauge G is attached to an object 1 to be measured by an adhesive. When load P is added to the object 1 to be measured and light is allowed to irradiate the same from a light source L, the crack of the gauge is at first developed especially when the load P is repeatedly added to said object 1 and a large amount of an exo-electron is discharged. By detecting the exo-electron, the change in surface physical properties can be measured in high sensitivity.
申请公布号 JPS59174745(A) 申请公布日期 1984.10.03
申请号 JP19830048904 申请日期 1983.03.25
申请人 HITACHI SEISAKUSHO KK 发明人 HIGUCHI SHIGEO
分类号 G01N23/02;G01N23/227 主分类号 G01N23/02
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