发明名称 Method for pattern-wise etching of a metallic coating film
摘要 The invention provides an improved process for providing wirings and electrodes of aluminum film on the surface of a substrate. Instead of the conventional method of directly forming an organic resist layer on the metal film, a remarkable improvement in the fineness and accuracy of patterning is obtained by providing a subsidiary masking layer, mainly composed of silicon dioxide, between the metal film and the organic resist layer; and pattern-wise etching by first etching the subsidiary masking layer through a patterned mask of the organic resist layer with a fluorine-containing etching gas to form a patterned subsidiary masking layer, and then etching the metal film with a chlorine-containing etching gas through the mask of the patterned subsidiary masking layer, followed by final removal of the remaining subsidiary masking layer.
申请公布号 US4474642(A) 申请公布日期 1984.10.02
申请号 US19830514793 申请日期 1983.07.18
申请人 TOKYO DENSHI KAGAKU CO., LTD. 发明人 NAKANE, HISASHI;NAKAYAMA, MUNEO;HASHIMOTO, AKIRA;NISHIMURA, TOSHIHIRO
分类号 C23F1/00;C23F4/00;H01L21/302;H01L21/3065;H01L21/312;H01L21/3213;(IPC1-7):C23F1/02;B44C1/22;C03C15/00;C03C25/06 主分类号 C23F1/00
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