| 摘要 |
PURPOSE:To provide a semiconductor integrated circuit which is capable of testing an output voltage and current characteristic by directly controlling an output circuit without application of two steps or more input pattern. CONSTITUTION:In case of operating a logic circuit 1, an external signal 9 is set to ''H'' while an external signal 10 is set to ''L'' level. At this time, an output signal from the logic circuit 1 is sent to an output circuit 6 through the AND gate 4 and OR gate 5. In case of testing output voltage and current characteristic, when the external signal 9 is set to ''L'' level, the AND gate 4 is invalidated and an output signal of logic circuit 1 is not sent to the output circuit 6. At this time, when the external signal 10 is set to ''H'' level or ''L'' level, the output circuit 6 can be controlled to the ''H'' level or ''L'' level through the OR gate 5. Under these conditions, output circuit DC characteristic test of semiconductor integrated circuit can be realized. |
