发明名称 METHOD AND DEVICE FOR MEASURING THICKNESS AND EXAMINING QUALITY OF THIN FILM PAPER OR THE LIKE BY THRESHOLD X-RAY
摘要 PURPOSE:To compensate the fluctuation in the radiation quantity from a threshold X-ray tube by measuring first the quantity of the threshold X-rays radiated from the threshold X-ray tube in the radiation source thereof and comparing and calculating the measured value and the measured value of the X-rays transmitted through a material to be measured. CONSTITUTION:The flux from a threshold X-ray tube 1 is throttled with a mask 2 and is made into a flux 3 for measurement, which is projected to a material 5 to be measured. A primary ionization chamber 4 installed right under the mask 2 measures the quantity of the threshold X-rays in the flux 3 transmitted through the mask 3. On the other hand, a secondary ionization chamber 6 measures the quantity of the threshold X-rays transmitted through the material 5. Both measured values are compared and calculated by a comparator 7. Then even if the radiation quantity from the threshold X-ray tube fluctuates, the stable measured value is obtd. Since both measurements are accomplished in the same atmosphere, the atm. pressure, temp., humidity, etc. acts equally on these measured values and are not the factor for an error within the range of the comparison and calculation thereof.
申请公布号 JPS59170752(A) 申请公布日期 1984.09.27
申请号 JP19800134830 申请日期 1980.09.26
申请人 SOFUTETSUKUSU KK 发明人 TAKAHASHI KIKUO;MIZUKI KIYOSHI
分类号 G01B15/02;G01N23/06;G01N23/16 主分类号 G01B15/02
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