| 摘要 |
According to the method of the invention, samples undergoing analysis for sorting are irradiated one by one in order to excite X-ray fluorescence. In order to take into account the background radiation, the quality whereof varies according to the frequency of the excited radiation, the radiation peak intensity I1 is measured, as well as the respective intensity I2 is measured at the same point of the radiation spectrum but in an essentially wider frequency range than the radiation peak. On the basis of the measured intensities I1 and I2 are defined the intensities of the X-ray fluorescence F and the background radiation T, and the ratio of these two is used as the selective criterion when sorting the analyzed samples. |
