发明名称 Measuring apparatus utilizing spectrum profile.
摘要 <p>Measuring or imaging of a characteristic of the structure of a medium is carried out utilizing the power spectrum profile of a received signal wave, which is derived from an incident beam pulse applied to the medium after travelling through the medium by transmission and reflection. The received signal wave is processed to obtain its cepstrum, which is filtered to separate slowly varying cepstra (including a desired Gaussian shaped pulse signal) from fast varying cepstra. The filtered cepstrum is subject to a further Fourier transformation to eliminate the effects of line cepstra in a lower frequency region and to eliminate the effects of the frequency dependence of reflecting indices of the structure. The target power spectrum is recovered by a series of inverse transformations. Correction apparatus utilizing momenta of the distored power spectrum to obtain the target Gaussian shaped profile is disclosed. </p>
申请公布号 EP0119844(A2) 申请公布日期 1984.09.26
申请号 EP19840301789 申请日期 1984.03.16
申请人 FUJITSU LIMITED 发明人 MIWA, HIROHIDE
分类号 G01S15/00;A61B8/00;A61B8/08;G01N22/02;G01N29/07;G01N29/34;G01N29/44;G01S7/292;G01S7/36;G01S7/52;G01S15/89;(IPC1-7):01S15/02;01S15/89;61B10/00;01N29/04;01S7/06;01N22/02 主分类号 G01S15/00
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