| 摘要 |
PURPOSE:To improve the reliability and maintainability of a device, by providing a microinstruction readout address being in idle state separately from normal readout addresses and performing the test of a control storage section in parallel with the normal operation. CONSTITUTION:A microinstruction address register 2 giving a readout address for a microinstruction stored in a control storage device 1 and a test address register 6 giving readout address for the test of the device 1 are provided. Further, an idle state display device 8 indicating the idle state of the device 1 is provided, and when the device 8 displays the idling state, the control with the microinstruction word read out from the device 1 is suppressed. The microinstruction in the device 1 is read out with the address of the register 6 revised with an adder 7. Thus, if correctable or incorrectable error is detected, the error is reported to an error report control circuit 5 in advance. |
