发明名称 Process for producing dielectrically isolated single crystal silicon devices
摘要 Well-oriented device quality silicon is formed on a dielectric material through a specific melting procedure. In this procedure, a body including polycrystalline or amorphous silicon overlying a dielectric is heated to a temperature close to the melting point of silicon. A narrow region of the amorphous or polycrystalline silicon whose length is substantially longer than its width is then melted using an energy source such as a laser. This long, narrow region is propagated through the amorphous or polycrystalline silicon to produce the desired device quality material.
申请公布号 US4473433(A) 申请公布日期 1984.09.25
申请号 US19820389871 申请日期 1982.06.18
申请人 AT&T BELL LABORATORIES 发明人 BOSCH, MARTIN A.;LEMONS, ROSS A.
分类号 C30B13/00;C30B13/24;H01L21/20;(IPC1-7):C30B1/08 主分类号 C30B13/00
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