发明名称 Method of producing a metallic structure with submicronic dimensions
摘要 The invention relates to the production of a metallic spatial structure, at least one dimension of which is less than a micron. The structure has a base 10, less than a micron in width, and of small height (< 1 mu ). To reduce its electrical resistance, this base 10 is surmounted by a thick metallic layer 11 several microns (3 to 5) in width. According to the method, an opening 9 of submicronic width in a first thin mask 2 is filled with metal: the metallisation is continued until a thick metallic layer 11 is obtained on the free surface of the first mask 2. A second mask 12 delimits the portion to be preserved in the thick metallic layer 11: the latter is "cut away" by chemical or physical attack. During removal of the two masks 2, 12, the portion of the first mask 2 between the metallic layer 11 and the support 1 of the structure can be preserved as a foundation. Two pillars 16 at the ends of the structure stabilise it. Application to the production of submicronic Schottky gates for microwave frequency field-effect transistors. <IMAGE>
申请公布号 FR2542921(A1) 申请公布日期 1984.09.21
申请号 FR19830004481 申请日期 1983.03.18
申请人 THOMSON CSF 发明人 PHAM NGU TUNG ET LINH NUYEN;NUYEN LINH
分类号 H01L21/285;H01L21/338;H01L29/423;(IPC1-7):H01L21/28;H01L21/44;H01L29/78 主分类号 H01L21/285
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