发明名称 MEASUREMENT OF ELECTRIC CHARACTERISTIC FOR SEMICONDUCTOR
摘要 PURPOSE:To secure an accurate contact without causing a plastic deformation of a lead terminal by pressing a measuring probe to measure with an insulation plate inserted between a base tape fixing a body and a lead terminal led out from the body. CONSTITUTION:A high frequency transistor TR1 is fixed at the position of a hole made in a base tape 4 with an adhesive tape 5 fastening the bottom of a package body 2 of the TR1. A clearance G is provided between a lead terminal 3 led straight sideways about mid-height from the side of the body 2 and the base tape. An insulator plate 8 such as teflon plate or the like having the thickness is inserted into the clearance G and a measuring probe 7 is pressed on the top of the lead terminal 3 to measure. This secures an accurate contact between the terminal and the probe without causing plastic deformation of the lead terminal.
申请公布号 JPS59164967(A) 申请公布日期 1984.09.18
申请号 JP19830039853 申请日期 1983.03.10
申请人 NIPPON DENKI KK 发明人 TAKEI TERUMUNE
分类号 G01R31/26 主分类号 G01R31/26
代理机构 代理人
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