发明名称 X-Ray examination apparatus
摘要 In an X-ray examination apparatus comprising an image intensifier tube and an optical light distribution system there is included an image field selector, by means of which, using a subbeam diverted from the imaging beam, a measurement field can be selected and by means of which this measurement field or a boundary outline thereof can be projected back into the imaging radiation path. Thus, it is achieved that during an examination stage an indication of the extent and location of a measurement field which is considered to be relevant for controlling the desired exposure for pictures to be produced, can be constantly displayed on the image screen of the television monitor.
申请公布号 US4472826(A) 申请公布日期 1984.09.18
申请号 US19830468232 申请日期 1983.02.22
申请人 U.S. PHILIPS CORPORATION 发明人 VAN DE VEN, JOHANNES T. A.
分类号 G03B42/02;A61B6/00;G01N23/04;G01N23/18;H04N7/18;H05G1/26;H05G1/36;H05G1/64;(IPC1-7):H05G1/30 主分类号 G03B42/02
代理机构 代理人
主权项
地址
您可能感兴趣的专利