发明名称 Apparatus and method of measuring surface heights
摘要 An improved apparatus and method for measuring surface heights is disclosed which yields a true height profile of the surface being measured. The apparatus and method is adapted to provide a straight and preferably level reference datum adjacent to the measured surface from which height and slope variation along the measured surface are automatically sensed, recorded and plotted. Three structural embodiments of the apparatus of the present invention are disclosed which permit either separate or simultaneous transverse or longitudinal surface data to be obtained during operation.
申请公布号 US4471530(A) 申请公布日期 1984.09.18
申请号 US19820420901 申请日期 1982.09.21
申请人 KALMAN FLOOR COMPANY 发明人 KIRVEN, WILLIAM T.
分类号 G01B11/24;G01B11/30;G01C7/04;G01C15/00;(IPC1-7):G01B11/24 主分类号 G01B11/24
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