发明名称 |
Double crystal X-ray spectrometer |
摘要 |
A two crystal detection system is provided for the measurement of X-ray spectra in which two half crystals are arranged at a fixed angular difference and each crystal is read out by a separate gas detector. In such a structure, both short "d" and long "d" spacings may be simultaneously measured. This construction of the present invention yields two integrated scanning channels in which both wavelength spectra can simultaneously be achieved.
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申请公布号 |
US4472825(A) |
申请公布日期 |
1984.09.18 |
申请号 |
US19820382015 |
申请日期 |
1982.05.26 |
申请人 |
NORTH AMERICAN PHILIPS CORPORATION |
发明人 |
JENKINS, RONALD |
分类号 |
G01N23/223;G01N23/207;G01T1/36;G21K1/06;(IPC1-7):G01N23/22 |
主分类号 |
G01N23/223 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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