发明名称 Double crystal X-ray spectrometer
摘要 A two crystal detection system is provided for the measurement of X-ray spectra in which two half crystals are arranged at a fixed angular difference and each crystal is read out by a separate gas detector. In such a structure, both short "d" and long "d" spacings may be simultaneously measured. This construction of the present invention yields two integrated scanning channels in which both wavelength spectra can simultaneously be achieved.
申请公布号 US4472825(A) 申请公布日期 1984.09.18
申请号 US19820382015 申请日期 1982.05.26
申请人 NORTH AMERICAN PHILIPS CORPORATION 发明人 JENKINS, RONALD
分类号 G01N23/223;G01N23/207;G01T1/36;G21K1/06;(IPC1-7):G01N23/22 主分类号 G01N23/223
代理机构 代理人
主权项
地址