发明名称 HIGH FREQUENCY POWER MEASURING DEVICE
摘要 PURPOSE:To reduce a coupling between an input and an output, and to execute a measurement stably and with a good reproducibility by providing a conductive housing provided with a terminal part to which a strip line on an insulating substrate contained in an openable and closable rectangular parallelepiped-like space is connected. CONSTITUTION:A side plate 15 is attached to a housing consisting of a base part 1 and a terminal assembly 3, and an upper cover 11 is placed on said plate and fixed by screwing a screw 12 into a tap 16 through a through-hole 14. When an interval (w) of two side plates 15 and an interval (h) between the lower face of the upper cover 11 and the upper face of the base part 1 are set to half or below of a wavelength in a measuring frequency, a propagation of TE10 and TE11 modes whose dimension is the lowest is prevented, therefore, other mode whose dimension is higher than that of said mode is not propagated at all, either. Therefore, a radiation of an electromagnetic wave in the measuring circuit is prevented, and also no feedback to the input side is generated. A semiconductor device to be measured 6 is placed on the measuring part.
申请公布号 JPS59163573(A) 申请公布日期 1984.09.14
申请号 JP19830039508 申请日期 1983.03.09
申请人 FUJITSU KK 发明人 FUKAYA JIYUN
分类号 G01R31/26 主分类号 G01R31/26
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