摘要 |
<p>A positive type photoresist composition comprises (a) a novolak resin and (b) a quinonediazide compound in wt. ratio of 1:1 to 6:1. The novolak resin is obtained by the addition condensation of a phenol and formaldehyde, in one stage by using as a catalyst an organic acid salt of a divalent metal more electropositive than hydrogen, or in two stages by using the acid catalyst in the subsequent stage, the phenol being at least one compound of formula:
<Chemistry id="chema01" num="0001"><Image id="ia01" he="20" wi="33" file="IMGA0001.TIF" imgContent="chem" imgFormat="TIFF" inline="no" /></Chemistry>wherein R is hydrogen or C1-4 alkyl group and being such that the average C number in the substituent per phenol nucleus is 0.5 to 1.5 and less than 50 mol% of the molecules have substituents at the ortho- or para-position with respect to the -OH group.</p><p>Preferred salts are acetates of Mg, Mn, Zn, Cd, Co, and Pb.</p><p>NMR spectra are shown of the resins.</p><p>The composition in solvent is coated on a support, and has a good resolving power.</p> |
申请人 |
SUMITOMO CHEMICAL COMPANY, LIMITED |
发明人 |
FURUTA, AKIHIRO;HANABATA, MAKOTO;YASUI, SEIMEI;HIROAKI, OSAMU;JINNO, NAOYOSHI |