发明名称 Photoresist composition containing a novolak resin.
摘要 <p>A positive type photoresist composition comprises (a) a novolak resin and (b) a quinonediazide compound in wt. ratio of 1:1 to 6:1. The novolak resin is obtained by the addition condensation of a phenol and formaldehyde, in one stage by using as a catalyst an organic acid salt of a divalent metal more electropositive than hydrogen, or in two stages by using the acid catalyst in the subsequent stage, the phenol being at least one compound of formula: &lt;Chemistry id="chema01" num="0001"&gt;&lt;Image id="ia01" he="20" wi="33" file="IMGA0001.TIF" imgContent="chem" imgFormat="TIFF" inline="no" /&gt;&lt;/Chemistry&gt;wherein R is hydrogen or C1-4 alkyl group and being such that the average C number in the substituent per phenol nucleus is 0.5 to 1.5 and less than 50 mol% of the molecules have substituents at the ortho- or para-position with respect to the -OH group.</p><p>Preferred salts are acetates of Mg, Mn, Zn, Cd, Co, and Pb.</p><p>NMR spectra are shown of the resins.</p><p>The composition in solvent is coated on a support, and has a good resolving power.</p>
申请公布号 EP0118291(A2) 申请公布日期 1984.09.12
申请号 EP19840301389 申请日期 1984.03.02
申请人 SUMITOMO CHEMICAL COMPANY, LIMITED 发明人 FURUTA, AKIHIRO;HANABATA, MAKOTO;YASUI, SEIMEI;HIROAKI, OSAMU;JINNO, NAOYOSHI
分类号 G03F7/023 主分类号 G03F7/023
代理机构 代理人
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